Value proposition

Increasing yield for semiconductor manufacturers with our powerful Big Data and AI analytics software.

DR YIELD is leading innovation in yield intelligence. Our customers enjoy improved efficiency, lower costs and increased yield with YieldWatchDog, the AI-supported, smart, flexible and high-performance software solution for semiconductor data visualization and automated process control.

YieldWatchDog: yield management with data integration, advanced analysis and enhanced visualization of all chip manufacturing and test data. It is capable of recognizing patterns and automatically notifies you if any irregularities occur. Using patented data aggregation technology and advanced algorithms, YieldWatchDog quickly integrates even large amounts of data into one large-scale, highly compressed database. YieldWatchDog’s user-friendly and intuitive interface gives you deep insight into your data. YieldWatchDog is a customizable, fully scalable, turnkey solution that saves on engineering time and IT infrastructure costs.

YieldWatchDog-XI is a deep learning framework based on neural networks and other smart algorithms for smart pattern recognition, intelligent tool analytics and multivariate monitoring.

Our Advanced Quality Module/PAT was specifically created for our customers in automotive and other quality-critical industries, and features analytics such as value shifts, neighborhood rules, shot and stack analysis and more.


Big Data Analysis, Yield Software Solutions, STDF, Semiconductor Data Analytics, Outlier detection, Pattern detection, Pattern recognition, Semiconductor Yield, AI for Semiconductor Manufacturing, Semiconductor Test, Yield Management System (YMS), Part Average Testing (PAT), Semiconductor Yield Analytics, Statistical Process Control (SPC) , Machine Learning, Pattern Classification, Defect analysis, and Predictive analytics